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Electron Microprobe Analysis And Scanning Microscopy In Geology


Autor: REED, S. J. B..

Editorial: Cambridge University Press

Idioma: Inglés

Estado: Consultar disponibilidad

Precio: 42.50€


ISBN: 978-0-521-14230-4

Edición nº 2

Año: Jun 2010

Nº de páginas: 192

Encuadernación: Rústica / Tapa Blanda

Descripción de la obra


Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

An updated treatment of EMPA and SEM specifically for geologists, including new developments and expanded treatment of some techniques Accessible to new users - no prior knowledge is assumed and technical detail is limited to that necessary to obtain results Copious illustrations including an enhanced library of X-ray spectra of minerals

Contents
1. Introduction; 2. Electron-specimen interactions; 3. Instrumentation; 4. Scanning electron microscopy; 5. X-ray spectrometers; 6. Element mapping; 7. X-ray analysis (1); 8. X-ray analysis (2); 9. Sample preparation.

Reviews
The subject is treated in a clear and logical fashion Dr Reed has produced an excellent and thoroughly readable book highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine

A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Mineralogy and Petrology Group, British Geological Survey in Analyst

This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes by far the most readable of the microscope/microprobe books that I have seen It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, School of Geological Sciences, Kingston University in Geoscientist

this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

Proyecto financiado por la Dirección General del Libro y Fomento de la Lectura, Ministerio de Cultura y Deporte» y «Financiado por la Unión Europea-Next Generation EU